|
||||
| Back to "Symposium" Search | Back to Main Search | |||
| Session 17: Optical Techniques 2 | ||||
| Location: Meeting Room J1-J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This session is a continuation of Optical Techniques 1. | ||||
| Editors: | Dr. Aaron Falk OptoMetrix, Inc, Renton, WA Mr. Dan J. Bodoh Freescale Semiconductor, Austin, TX Dr. Michael Bruce Independant, TX Dr. J. Joseph Clement Sandia National Laboratories, Albuquerque, NM Steven Kasapi NVIDIA, Santa Clara, CA Dr. Philippe Perdu CNES - French Space Agency, Toulouse, France Dr. Peilin Song IBM, Yorktown Heights, NY | |||
| Session Chair: | Dr. J. Joseph Clement Sandia National Laboratories, Albuquerque, NM | |||
| 8:00 AM | SYMP0518.1 | Advanced Optical Testing of an Array in 65 nm CMOS Technology | ||
| 8:25 AM | SYMP0518.2 | Analog Circuit Failure Analysis Using Time-Resolved Emission | ||