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| Device and Test 3 | ||||
| Location: Meeting Room J1 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editor: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| Session Chair: | Dr. Vijay Chowdhury Altera Corp., San Jose, CA | |||
| 1:00 PM | GEN057.1 | Electrical Overstress (EOS) in Semiconductor Devices: How to Differentiate and Document EOS due to Over-Current or Over-Voltage Conditions (New for 2005) | ||
| 1:30 PM | GEN057.2 | EOS/ESD - TLP Testing of Electronic Components | ||
| 3:00 PM | Break | |||
| 3:15 PM | GEN057.3 | Optoelectronics Failure Analysis | ||