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| Microscopy Tools 3 | ||||
| Location: Meeting Room J3 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editor: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| Session Chairs: | Dr. Sam Subramanian Freescale Semiconductor, Inc., Austin, TX Cosme Furlong Worcester Polytechnic Institute, WPI, Worcester, MA Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| 1:00 PM | GEN056.1 | Ultra-High Resolution in the SEM | ||
| 2:00 PM | GEN056.2 | Materials Characterization for Failure Analysis | ||
| 3:30 PM | Break | |||
| 3:45 PM | GEN056.3 | Monte Carlo Simulations for Materials Analysis (New For 2005) | ||
| 4:45 PM | GEN056.4 | The Role of the Atomic Force Microscope in Failure and Yield Analysis | ||