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Packaging 2
Location: Meeting Room J2 (San Jose McEnery Convention Center)
(Please check final room assignments on-site).
Session Description:

Editor:Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM
Session Chair:Ms. Becky Holdford Texas Instruments, Dallas, TX
8:00 AMAdvanced PCB and SMT Assembly Failure Modes and Mechanisms
10:00 AMBreak
10:15 AMSystem Level ESD Testing Using the Transmission Line Pulse (TLP) Methodology