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| Session 11: Case Histories 2 | ||||
| Location: Meeting Room J3 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This session is a continuation of Case Histories 1. | ||||
| Editors: | Mr. Tracy Myers ON Semiconductor, Gresham, OR Mr. Richard McClelland Philips Semiconductors, San Jose, CA Tim McGrady Atmel Corp., Colorado Springs, CO Mr. Tom Paquette Insight Analytical Labs, Colorado Springs, CO Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| Session Chair: | Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| 10:00 AM | SYMP058.1 | Case Studies of the Use of Image Processing in Metrology and Failure Analysis | ||
| 10:25 AM | SYMP058.2 | Single Device Characterization by Nano-probing to Identify Failure Root Cause | ||
| 10:50 AM | SYMP058.3 | Analysis of DRAM Standby Current Failure due to Hot Electron Induced Punch-through (HEIP) of PMOS transistor | ||