S. Sofer, Y. Fefer, Freescale Semiconductor Israel Ltd., Herzelia, Israel; Y. Shapira, Tel Aviv University, Tel Aviv, Israel

Summary: Indirect electrostatic discharge stressing of a chip with multiple isolated power domains was analyzed. The stress penetrates to the victim domain via common nets having non-negligible complex impedance and via coupling of the inter-domain parasitic capacitors and in some cases may cause chip damage.