|
||||
| Back to "Symposium" Search | Back to Main Search | |||
| Session 16: Optical Fault Isolation | ||||
| Location: Ballroom A (Renaissance Austin Hotel) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: Laser circuit stimulation began as a basic fault isolation technique involving recording the total circuit impedance as the laser is scanned over the circuit. The technique has expanded to include location of dynamic failures and been stressed by ever shrinking feature sizes. The Optical Fault Isolation session explores these new techniques and limitations with papers on SDL, LADA, TRE, and OBIRCH applications. | ||||
| Editor: | Dr. Aaron Falk OptoMetrix, Inc, Renton, WA | |||
| Session Chair: | Dr. Aaron Falk OptoMetrix, Inc, Renton, WA | |||
| 1:20 PM | Soft Defect Localization Technique for Design and Debug on DRAM Devices | |||
| 1:45 PM | Application of LADA for Post-Silicon Test Content and Diagnostic Tool Validation | |||
| 2:10 PM | Voltage Noise and Jitter Measurement Using Time-Resolved Emission | |||
| 2:35 PM | The Techniques for Short Failure Isolation on Advanced Technology | |||