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| Session 3: Test and Diagnostics | ||||
| Location: Ballroom B (Renaissance Austin Hotel) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This session has three papers focusing on improving test and diagnostics. The first uses IDDQ measurements from separate power pads to triangulate defect location and includes experiment results for a test chip. The second describes the use of place-and-route data for more efficient navigating between logical netlist and physical layout. Finally, the third paper investigates discharge failure in advanced technologies. | ||||
| Editor: | Dr. Shawn Blanton Carnegie Mellon University, Pittsburgh, PA | |||
| Session Chair: | Dr. Ronand (Shawn) Blanton Carnegie Mellon University, Pittsburgh, PA | |||
| 1:30 PM | Triangulating to a Defect's Physical Coordinates Using Multiple Supply Pad IDDQs: Test Chip Results | |||
| 1:55 PM | Logical-to-Physical Device Navigation Using Place-and-Route Data as an Alternative to LVS | |||
| 2:20 PM | Fundamental Considerations for CDM Failure in 90nm Products | |||