ISTFA Home   •   Exposition   •   To Register   •   ASM Homepage
Back to "Session 14: System Level Analysis and Test" Search
  Back to "Symposium" Search  Back to Main Search

Thursday, November 8, 2007 - 12:15 PM

Concepts for In Situ Diagnostics in Analog Microelectronic Circuits

T. Kolasa, A. Mendoza, Freescale Semiconductor, Tempe, AZ

View in WORD format

Summary: This paper will present ideas for incorporating full coverage in situ diagnostics into analog circuit designs.