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| Session 1: Emerging Concepts | ||||
| Location: Meeting Room J1-J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Mr. Christian Boit TUB Berlin University of Technology, Berlin, Germany James Demarest IBM, Poughkeepsie, NY | |||
| 10:00 AM | Integrated Raman - IR Thermography for Reliability and Performance Optimization, and Failure Analysis of Electronic Devices | |||
| 10:25 AM | Reduction of Acquisition Time for RIL, SDL and LADA | |||
| 10:50 AM | A New Approach for SRAM Soft Defect Root cause Identification | |||
| 11:15 AM | 3D Defect Localization by Measuring and Modeling the Dynamics of Heat Transport in Deep Sub-Micron Devices | |||