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| Session 7: Photon Based Techniques I | ||||
| Location: Meeting Room E145 (Oregon Convention Center ) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chairs: | Dr. Stephen Ippolito IBM, Yorktown Heights, NY Dr. Aaron Falk OptoMetrix, Inc, Renton, WA | |||
| 8:00 AM | Timing Sensitivity Analysis of Logical Nodes in Scan Design Integrated Circuits by Pulsed Diode Laser Stimulation | |||
| 8:25 AM | Dual Port RAM MBIST Failure Analysis using Time Resolved Dynamic Laser Stimulation | |||
| 8:50 AM | Mixed Frequency Detection of Thermal Laser Stimulation (TLS) and its Application in Failure Analysis | |||
| 9:15 AM | Differentiation between artifacts and true defects in 45 nm BEOL structures in MTLS technique | |||