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Session 15: Nanoprobing | ||||
Location: Portland Ballroom 254 (Oregon Convention Center ) | ||||
(Please check final room assignments on-site). | ||||
Session Description: | ||||
Session Chairs: | Dr. Shawn Decker South Dakota School of Mines, Rapid City, SD Mr. Taylor Cavanah DCG Systems, Inc, TX | |||
9:40 AM | Applications of Nanoprober Technique to the characterization of mismatched behavior in advanced SRAM devices | |||
10:05 AM | Failure Analysis of Single Shared Column Fail in DRAM Using Nano Probing Technique | |||
10:30 AM | Low Current AFP Characterization of Non-Visible Soft Transistor Defects | |||
10:55 AM | Characterization and analysis of 45nm node SRAM standby leakage | |||
11:20 AM | Investigation on Focused Ion Beam Induced Damage on Nanoscale SRAM by Nanoprobing | |||
11:45 AM | Lunch (attendees on their own) |