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| FIB | ||||
| Location: Meeting Room E141 (Oregon Convention Center ) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Session Chair: | Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| 1:00 PM | Failure Localization with Active and Passive Voltage Contrast in FIB and SEM | |||
| 2:30 PM | Focused Ion Beam — a Sample Preparation Tool | |||
| 3:15 PM | Break | |||
| 3:30 PM | FIB – A Design Repair / Fault Isolation Tool | |||