R. Medikonduri, Texas Instruments Incorporated, Stafford, TX

Summary: Nanoprobing method is effective in identifying an anomaly irrespective of whether a passive voltage contrast is seen or not. Knowing the nanoprobing method of chasing an anomaly in flash memory when no PVC seen or no leakage seen by AFM, will lead to higher FA success rate. Successful FA leads to prompt fixing of the issues in fab. Corrective actions in the fab, lead to lower defective units. Customers are kept happy with lower defective units and thus, the slogan “KEEP CUSTOMERS HAPPY” is justified.