The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM

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Wednesday, November 18, 2009 - 8:00 AM

Localized Epoxy Layer Formation on Surface Defect Using a Micro-brush in a Plucking System

K. L. Lin, Inotera Memories Inc., Taoyuan, Taiwan, Taoyuan, Taiwan; J. S. Luo, J. D. Russell, Inotera Memories, Inc., Taoyuan, Taiwan

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Summary: A novel micro-brush method to cover a defect with a micro-layer on the target’s surface using a micromanipulator of a plucking system has been introduced and successfully applied in the application of surface defect analysis without any damage or localization problem. Various sizes of micro-brushes, ranged between 10 and 330 ìm, were chosen to deal with different sizes of surface defects. The micro-brush method can be used for both in-film and on-surface defects.