The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM
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Tuesday, November 17, 2009 - 1:55 PM

Software Enhanced Time Resolved Laser Assisted Device Alteration with a Non-Pulsed Laser Source

K. Erington, J. Asquith, D. J. Bodoh, Freescale Semiconductor, Austin, TX

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Summary: We present a method of time-resolved laser assisted device alteration (or SDL) that uses a CW laser with no modulation. The time resolution is on the order of microseconds.