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The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
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| Session 2: Photon Beam Based Techniques - 1 | ||||
| Location: Meeting Room J1-J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: Photon Beam Based Techniques includes applications in the use of photons as an excitations source or as the signal to be analyzed from emission. | ||||
| Session Chairs: | Felix Beaudoin IBM Dr. Philippe Perdu CNES - French Space Agency, Toulouse, France | |||
| 1:30 PM | Pseudo-Soft Defect Localization | |||
| 1:55 PM | Software Enhanced Time Resolved Laser Assisted Device Alteration with a Non-Pulsed Laser Source | |||
| 2:20 PM | From Static to Full Dynamic Laser Stimulation | |||
| 2:45 PM | Annular Illumination and Solid Immersion | |||
| 3:10 PM | Backside IR Raman Temperature Measurements | |||