The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM
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Tuesday, November 17, 2009 - 11:40 AM

Laser Timing Probe with Frequency Mapping

J. C. H. Phang, Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), National University of Singapore, Singapore, Singapore; L. S. Koh, L. K. Ross, C. M. Chua, SEMICAPS PTE LTD, Singapore, Singapore, Singapore; H. L. Marks, NVIDIA, Santa Clara, CA

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