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The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM |
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| Session 1: Emerging Concepts | ||||
| Location: Meeting Room J1-J2 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: The emerging concepts session includes a variety of topics that introduce new and innovative ideas around Failure Analysis of microelectronics and microsystems components. This session would include new concepts and discoveries in Failure Analysis, leaving the advanced techniques to be placed in their respective sessions. | ||||
| Session Chairs: | Mr. Dan J. Bodoh Freescale Semiconductor, Austin, TX Mike Bruce Independent Consultant | |||
| 10:00 AM | Gradient Thermal Analysis by Induced Stimulus | |||
| 10:25 AM | Measurement of Bit Leakages in a Functional SRAM | |||
| 10:50 AM | Extended Circuit Edit, Analysis and Trimming Capabilities based on the Backside Focused Ion Beam created Ultra Thin Silicon Platforms | |||
| 11:15 AM | Subsurface Imaging of Multi-Level Integrated Circuits Using Scanning Electron Acoustic Microscopy | |||
| 11:40 AM | Laser Timing Probe with Frequency Mapping | |||