The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM
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Tuesday, November 17, 2009 - 3:10 PM

FAMOS Fail Bit Verification /Characterization Via NanoProbe

M. A. Dexter, Texas Instruments, Inc., dallas, TX; R. E. Stallcup, Zyvex Corporation, Richardson, TX; S. Gunturi, Texas Instruments, Inc., Dallas, TX

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