2009
Optical and Infrared FA Microscopy
John McDonald, Quantum Focus Instruments Corporation
An instrument designer discusses the design, use, and limitations for optics based failure analysis tools for circuits, with added emphasis on infrared microscopy. We begin with fundamental principles governing all microscopes and progress to exotic microscopes in the FA lab including polarized microscopes for liquid crystal hot spots, confocal microscopes, laser-based microscopes and infrared microscopes.