The 35th International Symposium for Testing and Failure Analysis (November 15-19, 2009) of ASM
Back to "Microscopy" Search
  Back to "Tutorial" Search  Back to Main Search

Monday, November 16, 2009 - 1:00 PM

Scanning Electron Microscopy

W. Vanderlinde, IARPA, College Park, MD

This tutorial covers the basic theory and practice of scanning electron microscopy. Practical ‘tips and tricks' are provided which will help in using the SEM effectively. 3-D stereo imaging is also discussed.