35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Case Study: Failure Analysis of Functional Shmoo Hole with Laser Voltage Probing

Wednesday, November 18, 2009

Exhibit Hall 3 (San Jose McEnery Convention Center)

Mr. Suk Ho Lee , Samsung Electronics co. Ltd, Young-in, South Korea

Mr. Yun Woo Lee , Samsung Electronics co. Ltd, Young-in, South Korea

Mr. Kyu Taek Lee , Samsung Electronics co. Ltd, Young-in, South Korea

Chi Young Choi , Samsung Electronics co. Ltd, Young-in, South Korea

Mr. Han Woo Shin , Neosem Inc., Suwon, South Korea

Mr. Yin Shyang Ng , DCG Systems, Fremont, CA

Ted Lundquist , DCG Systems, Fremont, CA

See more of: Session 7: Posters
See more of: Symposium