35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Start up and Evolution of a FEI DA 300 DBFIB for Automatic STEM Sample Preparation

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Start up and Evolution of a FEI DA 300 DBFIB for Automatic STEM Sample Preparation

Thursday, November 19, 2009: 10:15 AM
Meeting Room J3 (San Jose McEnery Convention Center)
Dr. James J. Demarest , IBM, Albany, NY
Dr. Zubin DeSouza , FEI, Hillsboro, OR
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