35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Measurement of Bit Leakages in a Functional SRAM

Tuesday, November 17, 2009: 10:25 AM

Meeting Room J1-J2 (San Jose McEnery Convention Center)

Dr. Xiaowei Deng , Texas Instruments Inc, Dallas, TX

Wah Kit Loh , Texas Instruments Inc, Dallas, TX

Beena Pious , Texas Instruments Inc, Dallas, TX

Jayesh Raval , Texas Instruments Inc, Dallas, TX

Bashar Khan , Texas Instruments Inc, Dallas, TX

Larry Liu , Texas Instruments Inc, Dallas, TX

Taylor Lowry , Texas Instruments Inc, Dallas, TX

DB Yoon , Texas Instruments Inc, Dallas, TX

Theodore W. Houston , Texas Instruments Inc, Dallas, TX

Randy McKee , Texas Instruments Inc, Dallas, TX

Abha Singh Kasper , Texas Instruments Inc, Dallas, TX

Dan Corum , Texas Instruments Inc, Dallas, TX