35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Session 1: Emerging Concepts

Tuesday, November 17, 2009: 10:00 AM-12:05 PM

Meeting Room J1-J2 (San Jose McEnery Convention Center)

Session Chairs:

Mr. Dan Bodoh and Mike Bruce

10:00 AM

Gradient Thermal Analysis by Induced Stimulus
Mr. Jim Colvin, FA Instruments

10:25 AM

Measurement of Bit Leakages in a Functional SRAM
Dr. Xiaowei Deng, Texas Instruments Inc; Wah Kit Loh, Texas Instruments Inc; Beena Pious, Texas Instruments Inc; Jayesh Raval, Texas Instruments Inc; Bashar Khan, Texas Instruments Inc; Larry Liu, Texas Instruments Inc; Taylor Lowry, Texas Instruments Inc; DB Yoon, Texas Instruments Inc; Theodore W. Houston, Texas Instruments Inc; Randy McKee, Texas Instruments Inc; Abha Singh Kasper, Texas Instruments Inc; Dan Corum, Texas Instruments Inc

10:50 AM

Extended Circuit Edit, Analysis and Trimming Capabilities based on the Backside Focused Ion Beam created Ultra Thin Silicon Platforms
Rudolf Schlangen, TUB Berlin Institute of Technology; Uwe Kerst, TUB Berlin Institute of Technology; Prof. Christian Boit, TUB Berlin Institute of Technology

11:15 AM

Subsurface Imaging of Multi-Level Integrated Circuits Using Scanning Electron Acoustic Microscopy
Ms. Lei Meng, Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), National University of Singapore; Mr. Alan G. Street, QUALCOMM, Inc; Prof. J.C.H. Phang, Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), National University of Singapore

11:40 AM

Laser Timing Probe with Frequency Mapping
Prof. J.C.H. Phang, Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR), National University of Singapore; L. S. Koh, SEMICAPS PTE LTD, Singapore; Howard Lee Marks, NVIDIA; L.K. Ross, SEMICAPS PTE LTD, Singapore; C.M. Chua, SEMICAPS PTE LTD, Singapore

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