35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Non-Destructive Failure Analysis in Organic Thin-Film Transistors

Wednesday, November 18, 2009: 9:15 AM

Meeting Room J3 (San Jose McEnery Convention Center)

Ms. Shih-Ting Liu , Integrated Service Technology Inc., Hsin-chu, Taiwan

Tao-Chi Liu , Integrated Service Technology Inc., Hsin-chu, Taiwan

Ming-Lun Chang , Integrated Service Technology Inc., Hsin-chu, Taiwan

King-Ting Chiang , Integrated Service Technology Inc., Hsin-chu, Taiwan

Su-Ping Chiu , Integrated Service Technology Inc., Hsin-chu, Taiwan

Jandel Lin , Integrated Service Technology Inc., Hsin-chu, Taiwan

Mr. Po-Yuan Lo , Department of Electrical Engineering, National Central University, Taoyuan, Taiwan

Pei-Wen Li , Department of Electrical Engineering, National Central University, Taoyuan, Taiwan