35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Interconnect Immobilization Process for Failure Analysis

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Interconnect Immobilization Process for Failure Analysis

Wednesday, November 18, 2009
Exhibit Hall 3 (San Jose McEnery Convention Center)
Ms. Julie Schuchman , Intel Corporation, Hillsboro, OR
Julia K. Willis , Intel Corporation, Hillsboro, OR
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