35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): The SRAM Soft Failure Analysis with SNM & TR Characterization by Nanoprobing in Sub 45nm

Tuesday, November 17, 2009: 1:55 PM

Meeting Room J3 (San Jose McEnery Convention Center)

Ms. Jakyung Hong , Samsung Electronics System LSI, Yongin, South Korea

Seongjun Cho , Samsung Electronics System LSI, Yongin, South Korea

YongWoon Han , Samsung Electronics System LSI, Yongin, South Korea

Hunseong Choi , Samsung Electronics System LSI, Yongin, South Korea

Sang-Deok Kwon , Samsung Electronics System LSI, Yongin, South Korea

Hongseok Kim , Samsung Electronics System LSI, Yongin, South Korea

Taeeun Kim , Samsung Electronics System LSI, Yongin, South Korea

Seungjun Son , Samsung Electronics System LSI, Yongin, South Korea

See more of: Session 3: Nanoprobing
See more of: Symposium