35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): EFFECTIVENESS of Non Destructive Physical Analysis Method Using X-Ray CT Imaging

EFFECTIVENESS of Non Destructive Physical Analysis Method Using X-Ray CT Imaging

Wednesday, November 18, 2009

Exhibit Hall 3 (San Jose McEnery Convention Center)

Mr. Akira Mizoguchi , Mitsubishi Electric Co., Kamakura, Japan

Koichiro Takeuchi , Mitsubishi Electric Co., Kamakura, Japan

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See more of: Session 7: Posters
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