35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Software Enhanced Time Resolved Laser Assisted Device Alteration with a Non-Pulsed Laser Source

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Software Enhanced Time Resolved Laser Assisted Device Alteration with a Non-Pulsed Laser Source

Tuesday, November 17, 2009: 1:55 PM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Mr. Kent Erington , Freescale Semiconductor, Austin, TX
Mr. John Asquith , Freescale Semiconductor, Austin, TX
Mr. Dan Bodoh , Freescale Semiconductor, Austin, TX
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