35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Session 2: Photon Beam Based Techniques - 1

Start | Browse by Day | Author Index

Session 2: Photon Beam Based Techniques - 1

Tuesday, November 17, 2009: 1:30 PM-3:35 PM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Session Chairs:
Felix Beaudoin and Dr. Philippe Perdu
1:30 PM
Pseudo-Soft Defect Localization
Dr. Paiboon Tangyunyong, Sandia National Laboratories; Rick McFarland, Sandia National Laboratories; Richard S. Flores, Sandia National Laboratories; Sean Pearson, Sandia National Laboratories; Marco O. Sanchez, Sandia National Laboratories
1:55 PM
Software Enhanced Time Resolved Laser Assisted Device Alteration with a Non-Pulsed Laser Source
Mr. Kent Erington, Freescale Semiconductor; Mr. John Asquith, Freescale Semiconductor; Mr. Dan Bodoh, Freescale Semiconductor
2:20 PM
From Static to Full Dynamic Laser Stimulation
Ms. Amjad Deyine, THALES & CNES (French Space Agency) laboratory
2:45 PM
Annular Illumination and Solid Immersion
Dr. Stephen Bradley Ippolito, IBM; Hirotoshi Terada, Hamamatsu Photonics, Systems Division
3:10 PM
Backside IR Raman Temperature Measurements
Dr. R. Aaron Falk, Quantum Focus Instruments, OptoMetrix Division; Tram Pham, Quantum Focus Instruments, OptoMetrix Division
See more of: Symposium
<< Previous Session | Next Session >>