35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Development of Laser-Based Variation Mapping Techniques – Another Way to Increase the Successful Analysis Rate On Analog & Mixed-Mode ICs

Thursday, November 19, 2009: 8:50 AM

Meeting Room J1-J2 (San Jose McEnery Convention Center)

Ms. Magdalena Anna Sienkiewicz , CNES (French Space Agency) (& Freescale Semiconductor), Toulouse, France

Mr. Kevin Sanchez , CNES - French Space Agency, Toulouse, France

Luigi Cattaneo , CNES, Toulouse, France

Dr. Philippe Perdu , CNES - French Space Agency, Toulouse, France

Dr. Abdellatif Firiti , Freescale Semiconductor, Toulouse, France

Olivier Crepel , Freescale Semiconductor SAS, Toulouse, France

Dean Lewis , IXL laboratory, Talence, France