35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Session 8: Photon Beam Based Techniques - 2

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Session 8: Photon Beam Based Techniques - 2

Thursday, November 19, 2009: 8:00 AM-9:40 AM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Session Chairs:
Dr. Stephen Bradley Ippolito and Dr. Aaron Falk
8:00 AM
Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation
Mr. Vincent Pouget, IMS, University of Bordeaux; E. Faraud, IMS, University of Bordeaux; K. Shao, IMS, University of Bordeaux; S. Jonathas, IMS, University of Bordeaux; D. Lewis, IMS, University of Bordeaux; D. Horain, PULSCAN; Gerald Haller, STMicroelectronics; V. Goubier, STMicroelectronics; Bernard Picart, ATMEL
8:25 AM
OBIC Measurements without Lasers or Raster-Scanning Based On Compressive Sensing
Ms. Ting Sun, Rice University; Dr. Gary L. Woods, Rice University; Chengbo Li, Rice University; Yin Zhang, Rice University; Kevin Kelly, Rice University; Marco F. Duarte , Rice University
8:50 AM
Development of Laser-Based Variation Mapping Techniques – Another Way to Increase the Successful Analysis Rate On Analog & Mixed-Mode ICs
Ms. Magdalena Anna Sienkiewicz, CNES (French Space Agency) (& Freescale Semiconductor); Mr. Kevin Sanchez, CNES - French Space Agency; Luigi Cattaneo, CNES; Dr. Philippe Perdu, CNES - French Space Agency; Dr. Abdellatif Firiti, Freescale Semiconductor; Olivier Crepel, Freescale Semiconductor SAS; Dean Lewis, IXL laboratory
9:15 AM
UV Emission Microscopy Development for High Band Gap Components
Mr. Mohsine Bouya, Thales Research and Technology; Mr. Dominique Carisetti, Thales Research and Technology; Mr. Jean-Claude Clement, Thales Research and Technology; Dr. Benoit Lambert, UMS; Dr. Philippe Perdu, CNES - French Space Agency; Prof. Nathalie N. Labat, IMS Laboratory; Nathalie N. Malbert, IMS Laboratory
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