35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Challenges Facing the Detection of Leakage Current in Integrated Circuit (IC) Devices

Thursday, November 19, 2009: 10:40 AM

Meeting Room J1-J2 (San Jose McEnery Convention Center)

Dr. Suey Li Toh , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

E. Hendarto , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

J. Sudijono , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

P.K. Tan , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Y.W. Goh , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

H.B. Lin , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Q. Deng , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

H. Tan , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

L. Zhu , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Q.F. Wang , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

H.L. Li , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

R. He , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

J. Lam , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Z.H. Mai , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore