35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Damage Induced Field Failures of Electrical Contacts

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Damage Induced Field Failures of Electrical Contacts

Thursday, November 19, 2009: 11:05 AM
Meeting Room J3 (San Jose McEnery Convention Center)
Mr. Aravind Munukutla , Intel Corporation, Hillsboro, OR
Mr. Randy Rahn , Intel Corporation, Hillsboro, OR
Mr. JS Lewis , Intel Corporation, Hillsboro, OR
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