35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Electrical Characterization of Different Failure Modes in Sub-100 Nm Devices Using Nanoprobing Technique

Tuesday, November 17, 2009: 2:20 PM

Meeting Room J3 (San Jose McEnery Convention Center)

Mr. Erwin Hendarto , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Suey Li Toh , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

John Sudijono , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Pik Kee Tan , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Hao Tan , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Yeow Whatt Goh , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Ling Zhu , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Qin Deng , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Hongbo Lin , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Ran He , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Hongliang Li , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Zhihong Mai , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

Jeffrey Lam , Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore

See more of: Session 3: Nanoprobing
See more of: Symposium