35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): UV Emission Microscopy Development for High Band Gap Components

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UV Emission Microscopy Development for High Band Gap Components

Thursday, November 19, 2009: 9:15 AM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Mr. Mohsine Bouya , Thales Research and Technology, Palaiseau, France
Mr. Dominique Carisetti , Thales Research and Technology, Palaiseau, France
Mr. Jean-Claude Clement , Thales Research and Technology, Palaiseau, France
Dr. Benoit Lambert , UMS, Orsay, France
Dr. Philippe Perdu , CNES - French Space Agency, Toulouse, France
Prof. Nathalie N. Labat , IMS Laboratory, Bordeaux, France
Nathalie N. Malbert , IMS Laboratory, Bordeaux, France
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