35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Backside IR Raman Temperature Measurements

Start | Browse by Day | Author Index

Backside IR Raman Temperature Measurements

Tuesday, November 17, 2009: 3:10 PM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Dr. R. Aaron Falk , Quantum Focus Instruments, OptoMetrix Division, Tukwila, WA
Tram Pham , Quantum Focus Instruments, OptoMetrix Division, Tukwila, WA
View in PDF format
See more of: Session 2: Photon Beam Based Techniques - 1
See more of: Symposium