35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Back-End-of-Line Quadrature-Clocked Voltage-Dependent Capacitance Measurements

Wednesday, November 18, 2009

Exhibit Hall 3 (San Jose McEnery Convention Center)

Dr. Stas V. Polonsky , IBM, Yorktown Height, NY

Paul Solomon , IBM, Yorktown Height, NY

Ernesto Shiling , IBM, Yorktown Height, NY

Laertis Economikos , IBM, Yorktown Height, NY

Manjul Bhushan , IBM, Yorktown Height, NY

Mark Ketchen , IBM, Yorktown Height, NY

See more of: Session 7: Posters
See more of: Symposium