35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): OBIC Measurements without Lasers or Raster-Scanning Based On Compressive Sensing

OBIC Measurements without Lasers or Raster-Scanning Based On Compressive Sensing

Thursday, November 19, 2009: 8:25 AM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Ms. Ting Sun , Rice University, Houston, TX
Dr. Gary L. Woods , Rice University, Houston, TX
Chengbo Li , Rice University, Houston, TX
Yin Zhang , Rice University, Houston, TX
Kevin Kelly , Rice University, Houston, TX
Marco F. Duarte , Rice University, Houston, TX