35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Low Temperature O2 Plasma Process for Scanning Capacitance Sample Preparation

Wednesday, November 18, 2009: 9:40 AM

Meeting Room J3 (San Jose McEnery Convention Center)

Mr. Donald W. Schulte , Hewlett Packard, Corvallis, OR

Terry McMahon , Hewlett Packard, Corvallis, OR

David D. Hall , Hewlett Packard, Corvallis, OR

Mark Johnson , Hewlett Packard, Corvallis, OR

William Stickle , Hewlett Packard, Corvallis, OR

Craig Sanders , Hewlett Packard, Corvallis, OR

Greg Long , Hewlett Packard, Corvallis, OR