35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Degradation Analysis of Thick Film Chip Resistors

Thursday, November 19, 2009: 8:25 AM

Meeting Room J3 (San Jose McEnery Convention Center)

Mr. Bhanu P. Sood , CALCE, University of Maryland, College Park, MD

Diganta Das , CALCE, University of Maryland, College Park, MD

Michael H. Azarian , CALCE, University of Maryland, College Park, MD

Michael Pecht , CALCE, University of Maryland, College Park, MD