35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Driving Fracture Mechanisms for Ground Silicon Dice

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Driving Fracture Mechanisms for Ground Silicon Dice

Thursday, November 19, 2009: 9:15 AM
Meeting Room J3 (San Jose McEnery Convention Center)
Dr. Roberto Dugnani , Exponent Failure Analysis Associates, Menlo Park, CA
Dr. Ming Wu , Exponent Failure Analysis Associates, Menlo Park, CA
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