35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Extended Circuit Edit, Analysis and Trimming Capabilities based on the Backside Focused Ion Beam created Ultra Thin Silicon Platforms

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Extended Circuit Edit, Analysis and Trimming Capabilities based on the Backside Focused Ion Beam created Ultra Thin Silicon Platforms

Tuesday, November 17, 2009: 10:50 AM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Rudolf Schlangen , TUB Berlin Institute of Technology, Berlin, Germany
Uwe Kerst , TUB Berlin Institute of Technology, Berlin, Germany
Prof. Christian Boit , TUB Berlin Institute of Technology, Berlin, Germany
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