35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): The Helium Ion Microscope for High Resolution Imaging, Materials Analysis, Circuit Edit and FA Applications

Thursday, November 19, 2009: 10:40 AM

Meeting Room J3 (San Jose McEnery Convention Center)

Dr. William B. Thompson , Carl Zeiss SMT, Peabody, MA

John Notte , Carl Zeiss SMT, Peabody, MA

Larry Scipioni , Carl Zeiss SMT, Peabody, MA

Mohan Ananth , Carl Zeiss SMT, Peabody, MA

Lewis Stern , Carl Zeiss SMT, Peabody, MA

Dave Ferranti , Carl Zeiss SMT, Peabody, MA

Chuong Huynh , Carl Zeiss SMT, Peabody, MA

Sybren Sijbrandij , Carl Zeiss SMT, Peabody, MA

Lou Farkas , Carl Zeiss SMT, Peabody, MA

Louise Barriss , Carl Zeiss SMT, Peabody, MA

Colin Sanford , Carl Zeiss SMT, Peabody, MA