35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Gradient Thermal Analysis by Induced Stimulus

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Gradient Thermal Analysis by Induced Stimulus

Tuesday, November 17, 2009: 10:00 AM
Meeting Room J1-J2 (San Jose McEnery Convention Center)
Mr. Jim Colvin , FA Instruments, San Jose, CA
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See more of: Session 1: Emerging Concepts
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