35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): FAMOS Fail Bit Verification /Characterization Via NanoProbe

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FAMOS Fail Bit Verification /Characterization Via NanoProbe

Tuesday, November 17, 2009: 3:10 PM
Meeting Room J3 (San Jose McEnery Convention Center)
Dr. Mark A. Dexter , Texas Instruments, Inc., dallas, TX
Dr. Richard E. Stallcup , Zyvex Corporation, Richardson, TX
Dr. Sarma Gunturi , Texas Instruments, Inc., Dallas, TX
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