35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Optoelectronic Methodologies for Characterization of MEMS and Electronic Packaging

Start | Browse by Day | Author Index

Optoelectronic Methodologies for Characterization of MEMS and Electronic Packaging

Sunday, November 15, 2009: 12:45 PM
Meeting Room J2 (San Jose McEnery Convention Center)
Dr. Cosme Furlong , Worcester Polytechnic Institute, WPI, Worcester, MA
See more of: Technology-Specific FA
See more of: Tutorial