35th International Symposium for Testing and Failure Analysis (November 15-19, 2009): Technology-Specific FA

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Technology-Specific FA

Sunday, November 15, 2009: 8:15 AM-4:30 PM
Meeting Room J2 (San Jose McEnery Convention Center)
Session Chairs:
Mr. Dan J. Bodoh and Mr. Jeremy A. Walraven
8:15 AM
Photovoltaic Systems: How Do They Work, and How Do They Fail?
Ms. Jennifer Granata, Sandia National Laboratories
10:15 AM
Break
10:30 AM
Introduction to MEMS: Materials and Fabrication Processes
Mr. Jeremy A. Walraven, Sandia National Labs
11:45 AM
Lunch
12:45 PM
Optoelectronic Methodologies for Characterization of MEMS and Electronic Packaging
Dr. Cosme Furlong, Worcester Polytechnic Institute, WPI
2:00 PM
Diagnosing Analog Circuits
Mr. Sarven Ipek, Analog Devices
3:00 PM
Break
3:15 PM
Emerging Trends in Failure Modes of Nanotechnology
Mr. Terence Kane, IBM
See more of: Tutorial
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